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The Evactron from XEI Scientific, Inc. removes hydrocarbons, organics and surface carbon from samples and electron microscopes.
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| Carbon deposits change |
| the apparent width of Cu |
| lines on a Si substrate |
 Remove unsightly scan squares - Shrink false EDS carbon peaks
- Minimise measurement errors
 
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Left: Scanned area on a Si sample. Right: Same area after 10 minutes of specimen and chamber cleaning using the Evactron, then re-scanning.
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Click on the links to the right for more information or contact us.
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